New paper! Self-Supervised Deformable Masked Autoencoders for Cranial Defects

Marek Wodzinski · June 3, 2024

This conference paper appears in the IEEE EMBC proceedings (2024). It proposes self-supervised deformable masked autoencoders that learn structural priors from unlabelled data to reconstruct cranial defects without dense ground truth, reducing annotation needs and producing high-quality reconstructions for CAD pipelines.

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